Microscopy and X-Ray Elemental Spectroscopy in Failure Analysis: Case Studies
Kevin P. Battjes
Impact Analytical, A Michigan Molecular Institute Center of Excellence
Midland, MI 48640
Optical and Scanning electron microscopy (SEM) techniques, coupled with energy dispersive X-ray analysis (EDS) are effective tools in investigating the cause of failures in articles made from plastics. Practical examples and findings are reviewed that have been used to solve customer problems in real world applications.
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