Impact Analytical provides a full complement of microscopy services, from optical to electron to atomic force. Instrumentation includes an Amray scanning electron microscope (SEM) with energy dispersive spectroscopy (EDS) to analyze bulk surfaces, cross sections and characterize objects in three dimensions. A Hitachi transmission electron microscope (TEM) enables the characterization of morphology and phase separation of ultra thin material sections at very high resolution.

Light microscopy begins with the Olympus stereo microscope, an invaluable tool for examination of material failure and morphology characterization, as well as analysis of larger scale specimens unsuitable for SEM imaging. The Leitz polarizing compound microscope is used extensively for analysis and measurement of the layer structure of films in the packaging industry. Atomic Force microscopy enables the surface mapping of extremely flat samples at profoundly high magnification, while scanning at room temperature and pressure with minimal sample disruption.

That depth of technique, coupled with the capabilities of Impact's other laboratories, enables our experienced analysts to derive critical structural information from your specimen. Digital image capture throughout means that data and surrounding reports are easily communicated within your organization. However, our exacting quality program and commitment to confidentiality ensure that these results are delivered only where they are requested.