Atomic Force Microscopy (AFM) is an important new analytical technique which is utilized to study the surface features of materials with a resolution down to the atomic level. In comparison to traditional microscopes, which use electron or photon beams to create images, an atomic force microscope uses a mechanical probe which uses various surface properties (e.g. topography, friction, hardness, etc.) to generate an image. AFM combines an ease of use with unparalleled ability to image surface features, and to do so without extensive sample preparation and under ambient conditions.

Atomic force microscopes can magnify surface features by as much as x100,000,000. As a result, single atoms and molecules on surfaces are often directly observable.

Examples

Some applications of AFM imaging have included:

• Imaging of carbon atoms in graphite
• Imaging of sodium chloride crystal surface with atomic resolution
• Visualization of biopolymeric chains as short as 5 angstroms
• Imaging of superconductive films
• Imaging of polyethylene to show individual methylene groups